d2Dplot: 2D X-ray diffraction data processing and analysis for through-the-substrate microdiffraction

Abstract

The d2Dplot computer program provides a set of tools for the visualization, processing and analysis of 2D X-ray diffraction (2DXRD) data. Among the operations available there are the sum/subtraction of 2DXRD images, conversion to 1D data (powder pattern), azimuthal plotting, calibration of instrumental parameters, background subtraction and a command-line mode to run operations inside data processing pipelines. The graphical user interface allows easy use of the program. It also includes two main features: (i) the possibility of creating a user compound database to help in the fast phase identification of similar samples, and (ii) a detailed peak analysis routine for the application of the through-the-substrate microdiffraction methodology.