High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies-Reference-Cited by-同舟云学术

High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

Published:2010-07-10 Issue:5 Volume:17 Page:631-643
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Strocov V. N.,Schmitt T.,Flechsig U.,Schmidt T.,Imhof A.,Chen Q.,Raabe J.,Betemps R.,Zimoch D.,Krempasky J.,Wang X.,Grioni M.,Piazzalunga A.,Patthey L.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2010/05/00/bf5029/bf5029.pdf

Reference29 articles.

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3. Performance of the elliptically polarizing undulator on SPEAR

4. Performance of the Dragon soft x‐ray beamline (invited)

5. Extended SX-700 type monochromator combining normal and grazing incidence optics for a new undulator beamline at SLS

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