Author:
Glover C. J.,Ridgway M. C.,Yu K. M.,Foran G. J.,Clerc C.,Hansen J. L.,Nylandsted-Larsen A.
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Cited by
4 articles.
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1. Comparative Studies Using EXAFS and PAC of Lattice Damage in Semiconductors;Hyperfine Interactions;2004-11
2. Structure of amorphous silicon investigated by EXAFS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-01
3. EXAFS;Springer Series in Surface Sciences;2003
4. Comparative Studies Using EXAFS and PAC of Lattice Damage in Semiconductors;HFI/NQI 2004