Accurate dosimetry in scanning transmission X-ray microscopesviathe cross-linking threshold dose of poly(methyl methacrylate)-Reference-Cited by-同舟云学术

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Accurate dosimetry in scanning transmission X-ray microscopesviathe cross-linking threshold dose of poly(methyl methacrylate)

Published:2012-09-06 Issue:6 Volume:19 Page:976-987
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Leontowich Adam F. G.,Hitchcock Adam P.,Tyliszczak Tolek,Weigand Markus,Wang Jian,Karunakaran Chithra

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2012/06/00/hf5212/hf5212.pdf

Reference66 articles.

1. NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space

2. Enhanced resolution of poly(methyl methacrylate) electron resist by thermal processing

3. Dosimetry with dyed and undyed acrylic plastic

4. Soft X-ray radiation-damage studies in PMMA using a cryo-STXM

5. Brewer, G. R. (1980). Electron-Beam Technology in Microelectronic Fabrication, p. 219. New York: Academic Press.

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