On High-Resolution Reciprocal-Space Mapping with a Triple-Crystal Diffractometer for High-Energy X-rays-Reference-Cited by-同舟云学术

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On High-Resolution Reciprocal-Space Mapping with a Triple-Crystal Diffractometer for High-Energy X-rays

Published:1998-03-01 Issue:2 Volume:5 Page:82-89
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Liss K. D.,Royer A.,Tschentscher T.,Suortti P.,Williams A. P.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/1998/02/00/he0222/he0222.pdf

Cited by 45 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bibliography;Nickel Base Single Crystals Across Length Scales;2022

2. Microstructure and chemical characterization;Nickel Base Single Crystals Across Length Scales;2022

3. Reciprocal space mapping and strain scanning using X-ray diffraction microscopy;Journal of Applied Crystallography;2018-09-13

4. Real-time study of transients during high-temperature creep of an Ni-base superalloy by far-field high-energy synchrotron X-ray diffraction;Journal of Applied Crystallography;2018-08-09

5. From Modeling of Plasticity in Single-Crystal Superalloys to High-Resolution X-rays Three-Crystal Diffractometer Peaks Simulation;Metallurgical and Materials Transactions A;2016-10-20

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