Phase composition depth profiles using spatially resolved energy dispersive X-ray diffraction
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Published:2004-11-11
Issue:6
Volume:37
Page:967-976
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ISSN:0021-8898
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Container-title:Journal of Applied Crystallography
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language:
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Short-container-title:J Appl Cryst
Author:
Jupe Andrew C.,Stock Stuart R.,Lee Peter L.,Naik Nikhila N.,Kurtis Kimberly E.,Wilkinson Angus P.
Abstract
Spatially resolved energy dispersive X-ray diffraction, using high-energy synchrotron radiation (∼35–80 keV), was used nondestructively to obtain phase composition profiles along the radii of cylindrical cement paste samples to characterize the progress of the chemical changes associated with sulfate attack on the cement. Phase distributions were acquired to depths of ∼4 mm below the specimen surface with sufficient spatial resolution to discern features less than 200 µm thick. The experimental and data analysis methods employed to obtain quantitative composition profiles are described. The spatial resolution that could be achieved is illustrated using data obtained from copper cylinders with a thin zinc coating. The measurements demonstrate that this approach is useful for nondestructively visualizing the sometimes complex transformations that take place during sulfate attack on cement-based materials. These transformations can be spatially related to microstructure as seen by computed microtomography.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
9 articles.
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