An X-ray determination of the thermal expansion of α-phase Cu–Si alloys at high temperature
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Published:1989-08-01
Issue:4
Volume:22
Page:380-381
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ISSN:0021-8898
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Container-title:Journal of Applied Crystallography
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language:
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Short-container-title:J Appl Cryst
Author:
Pradhan S. K.,De M.
Abstract
Lattice parameters for four Cu–Si alloys containing 2.2, 4.3, 6.4 and 8.7 at.% Si in the solid-solution range have been calculated in the temperature range 303–928 K. The lattice parameters increase slowly in a nonlinear manner with rise in temperature. The calculated linear thermal-expansion coefficients (α) at room temperature increase with increasing solute concentration (Si) but decrease almost linearly with increasing temperature, the rate of decrease being higher for alloys with higher solute concentration. All the alloys have almost the same average α value (α
av ~ 16.0 × 10−6 K−1), which is the value of α at the temperature interval 615–625 K for all the alloy compositions.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology