Layer-disordered wurtzite (ZnS-2H): diffuse X-ray scattering recorded by c-axis precession photography

Abstract

A novel type of X-ray diffraction pattern results when a layer-disordered crystal is photographed by X-ray precession using the stacking direction as the precession axis and no layer-line screen. The 10l, 20l, 21l and symmetry-equivalent rows of diffuse scattering of layer-disordered wurtzite (ZnS-2H) are represented by compound loops superimposed on the zero-level hk0 diffraction pattern. Closed loops result because the reciprocal-lattice rows associated with diffuse scattering remain in contact with the sphere of reflection during the precession cycle. Formulae for dimensional parameters of the compound loops of diffuse scattering are derived from the sphere-of-reflection construction.