A rapid method to assess X-ray area detectors by oriented protein crystal diffraction

Abstract

Siemens recently introduced the HI-STAR, a multiwire area detector with new read-out electronics. A performance comparison was made with the previous model, the X-1000. This note presents the method devised, which used X-ray diffraction from an oriented protein crystal and produced repeatable results in a short time with problems of absorption and sample decay eliminated. The method could have general applicability for the comparison of detectors, the rapid evaluation of modifications to a detector, or production line testing, especially because of the short time of each measurement.