Fast and easy Bragg reflex search for Berg–Barrett topography of misoriented crystals

Abstract

A fast search method for X-ray Bragg reflexes of misoriented crystals is presented. The method is also applicable to determine the accuracy of the crystal orientation. This technique is demonstrated by means of a simple setup for Berg–Barrett X-ray topography, consisting of a rotating sample holder on a two-circle diffractometer. The imaged area of the topograms is about 1 cm2, and the quality is comparable to the topograms taken by white-beam synchrotron X-ray topography.