Abstract
The likely error in the 2θ measurement of a particular powder reflection can be bracketed by a self-consistent error analysis. To a specific observed θm
value one assigns arbitrary increments {Δθm
} and calculates iteratively the corresponding increments of any other θn
according to the expression: \Delta \theta_{n} = \sin^{-1} {{{q \sin (\theta_{m} + \Delta \theta_{m})-\sin \theta_{n} \cos \Delta \theta_{n}}\over{\cos \theta_{n}}}}where q is the product of the square root of the ratio of the quadratic factors for (hmkmlm
) and (hnknln
) and a correction factor for refraction. By considering special coincidences for which the various Δθn
's are 0° or nil (0.000X°), one arrives at a likely bracketing interval for Δθm
. Continuing this process one computes the indicated errors for the remaining reflections. The intent of the error analysis is to induce the experimenter to seek the cause(s) of the indicated errors in the 2θ determinations, and to delimit more precisely the accuracy of lattice constants of cubic or uniaxial phases.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献