A Novel Method of Analyzing Peak Broadening Due to Mosaicity for Cubic Crystals on (001) Substrate using Double-Crystal X-ray Diffraction Methods
Author:
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Link
http://journals.iucr.org/j/issues/1997/06/00/zm0005/zm0005.pdf
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A simple method for analyzing peak broadening due to tilt and twist distributions in X-ray diffraction measurements of materials of arbitrary type;Journal of Applied Crystallography;2008-01-16
2. A new method for analysing peak broadening caused by compositional fluctuation in X-ray diffraction measurements;Journal of Applied Crystallography;2001-11-17
3. A Novel Analysis Method for Peak Broadening Due to Thin Structures in Double Crystal X-Ray Diffraction Measurements;Japanese Journal of Applied Physics;2001-09-15
4. A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements;Journal of Applied Crystallography;2000-12-01
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