Author:
Chapman Karena W.,Chupas Peter J.,Halder Gregory J.,Hriljac Joseph A.,Kurtz Charles,Greve Benjamin K.,Ruschman Chad J.,Wilkinson Angus P.
Abstract
Pair distribution function (PDF) methods have great potential for the study of diverse high-pressure phenomena. However, the measurement of high-quality, high-resolution X-ray PDF data (toQmax > 20 Å−1) remains a technical challenge. An optimized approach to measuring high-pressure total scattering data for samples contained within a diamond anvil cell (DAC) is presented here. This method takes into account the coupled influences of instrument parameters (photon energy, detector type and positioning, beam size/shape, focusing), pressure-cell parameters (target pressure range, DAC type, diamonds, pressure-transmitting media, backing plates, pressure calibration) and data reduction on the resulting PDF. The efficacy of our approach is demonstrated by the high-quality, high-pressure PDFs obtained for representative materials spanning strongly and weakly scattering systems, and crystalline and amorphous samples. These are the highest-resolution high-pressure PDFs reported to date and include those for α-alumina (toQmax = 20 Å−1), BaTiO3(toQmax= 30 Å−1) and pressure-amorphized zeolite (toQmax = 20 Å−1).
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
30 articles.
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