A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements. Erratum
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Published:2001-02-01
Issue:1
Volume:34
Page:87-87
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ISSN:0021-8898
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Container-title:Journal of Applied Crystallography
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language:
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Short-container-title:J Appl Cryst
Abstract
As a result of a printer's error, Fig. 9 of the paper by Nakashima [J. Appl. Cryst.(2000),33, 1376–1385] was incorrectly printed. The correct figure is given here.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology