Texture and residual-stress analysis using a kappa goniometer

Abstract

A kappa goniometer allowing the analysis of large samples (thickness up to 60 mm) has been constructed. It was designed to perform the analysis of crystalline texture and residual stress by X-ray diffraction with both χ- (or Ψ-) and Ω-type assembly configurations. Tilt-angle values up to 80° and 2θ values up to 165° can be reached. Validation has been achieved by checking the setting precision and the assembly reliability for the two types of configuration for which the system has been designed.