Author:
Takama T.,Iwasaki M.,Sato S.
Publisher
International Union of Crystallography (IUCr)
Cited by
32 articles.
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1. Characterization of Dislocations in Semiconductor Heterostructures Using X-ray Rocking Curve Pendellösung;Journal of Electronic Materials;2017-11-03
2. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06
3. Useful formulae;Dynamical Theory of X-Ray Diffraction;2003-11-06
4. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06
5. Preface;Dynamical Theory of X-Ray Diffraction;2003-11-06