Abstract
An appropriate choice of the function minimized permits linearization of the least-squares determination of the matrix which transforms the diffraction indices into the components of the reciprocal vector in the diffractometer φ-axis system of coordinates. The coefficients of the least-squares equations are based on diffraction indices and measured diffractometer angles of three or more non-coplanar setting reflexions.
Publisher
International Union of Crystallography (IUCr)
Cited by
19 articles.
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