Spherically bent analyzers for resonant inelastic X-ray scattering with intrinsic resolution below 200 meV-Reference-Cited by-同舟云学术

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Spherically bent analyzers for resonant inelastic X-ray scattering with intrinsic resolution below 200 meV

Published:2005-06-15 Issue:4 Volume:12 Page:473-478
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Collart Emilie,Shukla Abhay,Gélébart Frédéric,Morand Marc,Malgrange Cécile,Bardou Nathalie,Madouri Ali,Pelouard Jean-Luc

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2005/04/00/bf5004/bf5004.pdf

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