A new X-ray spectrometer for high-resolution Compton profile measurements at SPring-8-Reference-Cited by-同舟云学术

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A new X-ray spectrometer for high-resolution Compton profile measurements at SPring-8

Published:2001-01-01 Issue:1 Volume:8 Page:26-32
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Hiraoka N.,Itou M.,Ohata T.,Mizumaki M.,Sakurai Y.,Sakai N.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2001/01/00/ma2003/ma2003.pdf

Cited by 48 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rational Design of Battery Materials Through Spectroscopic Characterization and Computational Modeling of Redox Orbitals;Topics in Applied Physics;2024

2. High-resolution Compton spectroscopy using x-ray microcalorimeters;Review of Scientific Instruments;2022-11-01

3. Identifying Redox Orbitals and Defects in Lithium-Ion Cathodes with Compton Scattering and Positron Annihilation Spectroscopies: A Review;Condensed Matter;2022-07-26

4. Momentum density spectroscopy of Pd: Comparison of 2D-ACAR and Compton scattering using a 1D-to-2D reconstruction method;Physical Review B;2021-08-30

5. Tomographic reconstruction of oxygen orbitals in lithium-rich battery materials;Nature;2021-06-09

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