Application of a CdTe Solid-State Detector to Polarization-Dependent Total-Reflection Fluorescence XAFS Measurements
Author:
Publisher
International Union of Crystallography (IUCr)
Subject
Instrumentation,Nuclear and High Energy Physics,Radiation
Link
http://journals.iucr.org/s/issues/1996/04/00/km0008/km0008.pdf
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