An X-ray nanodiffraction technique for structural characterization of individual nanomaterials-Reference-Cited by-同舟云学术

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An X-ray nanodiffraction technique for structural characterization of individual nanomaterials

Published:2005-02-22 Issue:2 Volume:12 Page:124-128
ISSN:0909-0495
Container-title:Journal of Synchrotron Radiation
language:
Short-container-title:J Synchrotron Radiat

Author:

Xiao Y.,Cai Z.,Wang Z. L.,Lai B.,Chu Y. S.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Link

http://journals.iucr.org/s/issues/2005/02/00/xj5004/xj5004.pdf

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