Abstract
A method for calculating the properties of structures obtained by projection is developed and applied to a three-dimensional generalization of the Penrose tiling. The diffraction pattern is shown in general to consist of a dense set of delta-function peaks. For the Penrose model the pattern in addition has the symmetry of the icosahedron.
Publisher
International Union of Crystallography (IUCr)
Cited by
464 articles.
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