On the X-ray analysis of thin subsurface layers. Bicrystal diffraction analogues-Reference-Cited by-同舟云学术

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On the X-ray analysis of thin subsurface layers. Bicrystal diffraction analogues

Published:1988-01-01 Issue:1 Volume:44 Page:25-33
ISSN:0108-7673
Container-title:Acta Crystallographica Section A Foundations of Crystallography
language:
Short-container-title:Acta Cryst Sect A

Author:

Afanas'ev A. M.,Fanchenko S. S.

Publisher

International Union of Crystallography (IUCr)

Subject

Structural Biology

Link

http://journals.iucr.org/a/issues/1988/01/00/vs0071/vs0071.pdf

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Deterministic X-ray Bragg coherent diffraction imaging as a seed for subsequent iterative reconstruction;Journal of Physics Communications;2018-08-29

2. Unambiguous reconstruction of the complex amplitude reflection coefficient of a laterally homogeneous crystal using analyser-based phase-contrast imaging;Journal of Applied Crystallography;2007-07-13

3. Advanced X-ray analysis techniques to investigate aging of micromachined silicon actuators for space application;Microelectronics Reliability;2003-07

4. Triple crystal diffractometry, x-ray standing wave, and transmission electron microscopy investigation of shallow BF[sub 2] implantation in Si;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2002

5. Triple-crystal diffractometry, x-ray standing wave and reciprocal space mapping study of homoepitaxial grown Si layers;Journal of Physics D: Applied Physics;2000-08-14

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