The Instrumental Broadening Function of the Bartels Five-Crystal X-ray Diffractometer

Author:

Healey P. D.,Ayers J. E.

Publisher

International Union of Crystallography (IUCr)

Subject

Structural Biology

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Characterization of Dislocations in Semiconductor Heterostructures Using X-ray Rocking Curve Pendellösung;Journal of Electronic Materials;2017-11-03

2. Dynamical X-Ray Diffraction Analysis of Triple-Junction Solar Cells on Germanium (001) Substrates;International Journal of High Speed Electronics and Systems;2017-06-27

3. Simulated x-ray diffraction from pseudomorphic GaAs/In0.3Ga0.7As superlattice high electron mobility transistor heterostructures on GaAs (001) substrates;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2017-05

4. Comparison of the phase-invariant and mosaic crystal models for dynamical x-ray diffraction from metamorphic InxGa1−xAs/GaAs (001) structures;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-03

5. X-ray characterization of dislocation density asymmetries in heteroepitaxial semiconductors;Applied Physics Letters;2008-05-19

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