Abstract
A procedure is described for estimating the background outline in powder diffraction patterns. It essentially consists of an extension of traditional smoothing procedures to include Bragg peaks in addition to profile random fluctuations. This approach is particularly suited for dealing with diffraction patterns obtained from semicrystalline polymer samples; some applications to this kind of experimental data are presented.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
61 articles.
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