An elastically bent silicon monochromator for a neutron diffractometer

Abstract

A new type of elastically bent perfect Si (EBP-Si) monochromator for a neutron diffractometer dedicated to protein crystallography has been developed and successfully applied to two such diffractometers. It was experimentally demonstrated that the monochromatic neutron intensity increased and the beam was focused at the sample position when the monochromator was suitably bent. A specially designed bender for the EBP-Si monochromator, already applied to several diffractometers, is described. The distinctive features of the EBP-Si monochromator are summarized.