Author:
Steuwer A.,Santisteban J. R.,Turski M.,Withers P. J.,Buslaps T.
Abstract
The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10−5. The measurements have been validated with complementary techniques or reference data.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
73 articles.
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