Asymmetric X-ray line broadening of plastically deformed crystals. II. Evaluation procedure and application to [001]-Cu crystals

Abstract

In paper I [Groma, Ungár & Wilkens (1988). J. Appl. Cryst. 21, 47–53] a theory was developed to interpret the asymmetric X-ray line broadening of plastically deformed crystals. It was shown that the dislocation structure can be described by five distinct parameters, namely the dislocation density, the mean quadratic spatial fluctuation of the dislocation density, the effective outer cut-off radius, the dipole polarization and the spatial fluctuation of the dipole polarization of the dislocation structure. In this paper a procedure is developed to evaluate these parameters from the Fourier transform of the line profiles. The theory and this procedure are tested by applying it to the asymmetric line profiles of tensile-deformed Cu single crystals orientated for ideal multiple slip. The asymmetry of these profiles is assigned to the dipole polarization of the dislocation cell structure and is directly correlated to residual long-range internal stresses. It is shown that the data can be interpreted in terms of the quasi-composite model of the dislocation cell structure developed earlier for the same material.