A high-resolution X-ray diffractometer for the study of imperfect materials

Abstract

A high-resolution X-ray diffractometer devoted to the study of imperfect materials (mainly oxides and ceramics) is presented. It is based on a rotating anode generator, a four-bounce monochromator, a five-movement sample holder and a curved position-sensitive detector (PSD). This setup allows rapid acquisition of a reciprocal-space map (in less than 10 h) even for very poorly diffracting materials. The two-dimensional instrumental profile is calculated taking into account each optical element in the beam path. The one-dimensional instrumental profiles corresponding to widely used scans (ω scan, θ–2θ scan, rocking curve and powder scan) are also calculated. In the three former cases, the setup exhibits an excellent angular resolution (0.003°), whereas in the latter case the resolution is lowered by one order of magnitude at the benefit of a strong increase in the collected intensity. The possibilities of this diffractometer are illustrated with three examples: an epitaxic layer, a microstructured single crystal and a powder.