Author:
Fujiwara A.,Ishii K.,Watanuki T.,Suematsu H.,Nakao H.,Ohwada K.,Fujii Y.,Murakami Y.,Mori T.,Kawada H.,Kikegawa T.,Shimomura O.,Matsubara T.,Hanabusa H.,Daicho S.,Kitamura S.,Katayama C.
Abstract
A synchrotron radiation X-ray powder diffractometer for samples of very small amount has been developed to collect high-quality diffraction patterns under extreme conditions,i.e.at low temperature and/or high pressure. A new cylindrical imaging plate (CIP) is used as a detector, in addition to a conventional flat-type imaging plate (FIP). By using the CIP system, the diffraction data in a diffraction angle range −44 ≤ 2θ ≤ 122° are collected with a dynamic range of about 106. The alignment of the diffractometer, measurement and analysis are automatically operated by a workstation. A performance test shows that the CIP system has spatial resolution of about 0.07° with a dynamic range of 106. The diffraction pattern of a standard sample of Si measured by the CIP system has high quality; the refinement of the structure reachesRw= 3.68% even in the case of a small amount of sample (about 2 µg) and a short exposure time (60 s). Examples of experiments at low temperatures under ambient and high pressures are also presented.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
53 articles.
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