Author:
Stockmeier Matthias,Magerl Andreas
Abstract
A focusing Laue diffractometer for high-energy X-rays of up to 300 keV in a laboratory environment is presented. The long attenuation length for X-ray energies above 50 keV allows for the non-destructive investigation of structural issues and bulk properties of single crystals. Furthermore, massive sample environments such as high-temperature furnaces can be used more easily. With an area detector, anisotropic mosaicities or crystallite structure become visible without any rocking movement of the sample.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
20 articles.
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