Quantitative Texture Analysis from X-ray Diffraction Spectra-Reference-Cited by-同舟云学术

Quantitative Texture Analysis from X-ray Diffraction Spectra

Published:1997-08-01 Issue:4 Volume:30 Page:443-448
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Wang Y. D.,Zuo L.,Liang Z. D.,Laruelle C.,Vadon A.,Heizmann J. J.

Abstract

A method to obtain the orientation distribution function (ODF) of a polycrystalline material directly from X-ray diffraction spectra is presented. It uses the maximum-texture-entropy assumption to reduce the diffraction data needed for the ODF analysis. The validity of this new method is illustrated through two model examples.

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/1997/04/00/hn0058/hn0058.pdf

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