Indirect two-trace method to determine a faceted low-energy interface between two crystallographically correlated crystals

Abstract

An indirect two-trace method to determine interfaces between two crystals with a uniquely defined interface plane is proposed. It involves preparation of only one sample surface, instead of the two perpendicular sample surfaces required by the traditional two-trace method. By making use of two independent interface trace vectors from one uniquely defined interface and the orientations of their adjacent crystals, the interface plane normal and thus the interface plane in the two correlated crystal systems can be determined through numerical calculations concerning coordinate system change. The new method is widely applicable to identify any uniquely defined and reproducible interfaces between crystallographically correlated crystals, even slip systems, provided that they are microscopically visible and crystallographically of the same nature. It can simplify the experimental procedure, increase the determination accuracy and broaden the scope of interface studies.