The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines
Author:
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Link
http://journals.iucr.org/j/issues/1972/02/00/a09481/a09481.pdf
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloy;Materials Characterization;2005-02
2. X-ray diffraction line broadening from thermally deposited gold films;Journal of Applied Crystallography;2000-10-01
3. A method for the interpretation of the Warren–Averbach mean-squared strains and its application to recovery in aluminium;Journal of Applied Crystallography;1983-04-01
4. The variance as a measure of line broadening: corrections for truncation, curvature and instrumental effects;Journal of Applied Crystallography;1982-06-01
5. Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis;Fresenius' Zeitschrift für analytische Chemie;1982-01
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