X-ray diffraction mapping on a curved surface

Abstract

An efficient method for X-ray diffraction data collection mapping on a given curved surface has been developed. The method uses a laser–video autozalignment system to collect a map of heights on a fine mesh grid. It also reconstructs the surface geometry and determines surface normals on a three-dimensional surface fit. An algorithm was used to calculate the required rotation and tilt angles to coincide the sample normal with the diffraction center before each exposure. A set of diffraction frames collected using this technique was analyzed in order to superimpose a phase transformation map onto a typical zirconia ceramic sample. With this method, mapping of phase and stresses on a complex surface has been demonstrated. This approach is broadly applicable to many important areas of study.