Twinning in La0.95Sr0.05Ga0.9Mg0.1O2.92crystal studied by white-beam (Laue) X-ray microdiffraction

Abstract

The investigation of twin structure in La0.95Sr0.05Ga0.9Mg0.1O2.92perovskite-type crystals has been undertaken using the technique of white-beam X-ray microdiffraction. The sample shows definite twinning which is reflected in the Laue patterns as apparent splitting of the peaks. Reflections from the different domains were indexed separately. Positional shifts of twin domain spots with respect to the reference matrix spot, arising from the mutual misorientation of diffraction vectors, were measured on Laue patterns and compared with calculated values in order to solve the twin laws in this system. The dominant twin operations were found to be (12\bar{1}) and (10\bar{1}) mirror reflections.