Author:
Choe Hyeokmin,Gorfman Semën,Hinterstein Manuel,Ziolkowski Michael,Knapp Michael,Heidbrink Stefan,Vogt Marco,Bednarcik Jozef,Berghäuser Andreas,Ehrenberg Helmut,Pietsch Ullrich
Abstract
The design and testing of the new MAD-STROBO data acquisition system are reported. The system realizes stroboscopic collection of high-resolution X-ray powder diffraction profiles under a dynamically applied electric field. It synchronizes an externally applied stimulus and detected X-ray photons. The feasibility of detecting sub-millidegree shifts of powder diffraction profiles with microsecond time resolution is demonstrated. MAD-STROBO may be applied for the investigation of various macroscopic and domain-related processes induced by an external perturbation, such as elasticity or piezoelectricity.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
11 articles.
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