Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals

Author:

Gradwohl Kevin-P.,Danilewsky Andreas N.,Roder Melissa,Schmidbauer Martin,Janicskó-Csáthy JózsefORCID,Gybin Alexander,Abrosimov Nikolay,Sumathi R. RadhakrishnanORCID

Abstract

White-beam X-ray topography has been performed to provide direct evidence of micro-voids in dislocation-free high-purity germanium single crystals. The voids are visible because of a dynamical diffraction contrast. It is shown that voids occur only in dislocation-free parts of the crystal and do not show up in regions with homogeneous and moderate dislocation density. It is further suggested that the voids originate from clustering of vacancies during the growth process. A general method is proposed to verify the presence of voids for any crystalline material of high structural perfection.

Funder

Bundesministerium für Bildung und Forschung

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Reference20 articles.

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