Author:
van Genderen E.,Clabbers M. T. B.,Das P. P.,Stewart A.,Nederlof I.,Barentsen K. C.,Portillo Q.,Pannu N. S.,Nicolopoulos S.,Gruene T.,Abrahams J. P.
Abstract
Until recently, structure determination by transmission electron microscopy of beam-sensitive three-dimensional nanocrystals required electron diffraction tomography data collection at liquid-nitrogen temperature, in order to reduce radiation damage. Here it is shown that the novel Timepix detector combines a high dynamic range with a very high signal-to-noise ratio and single-electron sensitivity, enablingab initiophasing of beam-sensitive organic compounds. Low-dose electron diffraction data (∼0.013 e− Å−2 s−1) were collected at room temperature with the rotation method. It was ascertained that the data were of sufficient quality for structure solution using direct methods using software developed for X-ray crystallography (XDS,SHELX) and for electron crystallography (ADT3D/PETS,SIR2014).
Publisher
International Union of Crystallography (IUCr)
Subject
Inorganic Chemistry,Physical and Theoretical Chemistry,Condensed Matter Physics,General Materials Science,Biochemistry,Structural Biology
Reference38 articles.
1. Arndt, W. & Wonacott, A. J. (1977). Editors. The Rotation Method in Crystallography. Amsterdam: North-Holland.
2. A pixel detector for the protein crystallography beamline at the SLS
3. Bruker (2004). SAINT-Plus and XPREP. Bruker Axs Inc., Madison, Wisconsin, USA.
4. Crystal structure determination and refinementviaSIR2014
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