Characteristics of X-ray and gamma radiation detectors based on polycrystalline CdTe and CdZnTe films

Author:

Utamuradova Sharifa1,Muzafarova Sultanposha1,Abdugafurov Abdulla1,Fayzullaev Kakhramon1,Naurzalieva Elmira1,Rakhmanov Dilmurod1

Affiliation:

1. Institute of Semiconductor Physics and Microelectronics at the National University of Uzbekistan

Abstract

Based on CdTe and CdZnTe detectors a number of promising devices were created, which found their application in metallurgy, in solving the problems of customs control and control of nuclear materials, as well as matrix detectors created for the manufacture of medical devices and devices for space research. Detectors, created on the basis of polycrystalline semiconductor CdTe and CdZnTe films with a columnar structure on a molybdenum substrate with a thickness d = 30150 μm, had a specific resistance p > 10^5 10^8 W-cm. The energy resolution of the CdTe and CdZnTe detectors at room temperature reached ~ 5 keV on the 59.6 keV 241Am line.

Publisher

Joint-Stock Company Scientific and Production Association - ORION

Subject

General Physics and Astronomy

Reference9 articles.

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