A buckling-based metrology for measuring the elastic moduli of polymeric thin films-Reference-Cited by-同舟云学术

A buckling-based metrology for measuring the elastic moduli of polymeric thin films

Published:2004-07-11 Issue:8 Volume:3 Page:545-550
ISSN:1476-1122
Container-title:Nature Materials
language:en
Short-container-title:Nature Mater

Author:

Stafford Christopher M.,Harrison Christopher,Beers Kathryn L.,Karim Alamgir,Amis Eric J.,VanLandingham Mark R.,Kim Ho-Cheol,Volksen Willi,Miller Robert D.,Simonyi Eva E.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://www.nature.com/articles/nmat1175.pdf

Reference34 articles.

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3. VanLandingham, M.R., Villarrubia, J.S., Guthrie, W.F. & Meyers, G.F. Nanoindentation of polymers: An overview. Macromol. Symp. 167, 15–43 (2001).

4. Du, B.Y. et al. Nanostructure and mechanical measurement of highly oriented lamellae of melt-drawn HDPE by scanning probe microscopy. Macromolecules 33, 7521–7528 (2000).

5. Du, B.Y., Tsui, O.K.C., Zhang, Q.L. & He, T.B. Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy. Langmuir 17, 3286–3291 (2001).

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