Author:
Thierfelder William E.,van Deursen Jan M.,Yamamoto Koh,Tripp Ralph A.,Sarawar Sally R.,Carson Richard T.,Sangster Mark Y.,Vignali Dario A. A.,Doherty Peter C.,Grosveld Gerard C.,Ihle James N.
Publisher
Springer Science and Business Media LLC
Cited by
1009 articles.
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