Controllable positive exchange bias via redox-driven oxygen migration-Reference-Cited by-同舟云学术

Controllable positive exchange bias via redox-driven oxygen migration

Published:2016-03-21 Issue:1 Volume:7 Page:
ISSN:2041-1723
Container-title:Nature Communications
language:en
Short-container-title:Nat Commun

Author:

Gilbert Dustin A.^ORCID,Olamit Justin,Dumas Randy K.,Kirby B. J.,Grutter Alexander J.,Maranville Brian B.,Arenholz Elke,Borchers Julie A.,Liu Kai^ORCID

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Chemistry

Link

http://www.nature.com/articles/ncomms11050.pdf

Reference48 articles.

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3. Yang, J. J., Strukov, D. B. & Stewart, D. R. Memristive devices for computing. Nat. Nanotechnol. 8, 13–24 (2013).

4. Jeong, J. et al. Suppression of metal-insulator transition in VO2 by electric field–induced oxygen vacancy formation. Science 339, 1402–1405 (2013).

5. Bauer, U., Przybylski, M., Kirschner, J. S. D. & Beach, G. Magnetoelectric charge trap memory. Nano Lett. 12, 1437–1442 (2012).

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