Author:
Amemiya Chris T.,Alföldi Jessica,Lee Alison P.,Fan Shaohua,Philippe Hervé,MacCallum Iain,Braasch Ingo,Manousaki Tereza,Schneider Igor,Rohner Nicolas,Organ Chris,Chalopin Domitille,Smith Jeramiah J.,Robinson Mark,Dorrington Rosemary A.,Gerdol Marco,Aken Bronwen,Biscotti Maria Assunta,Barucca Marco,Baurain Denis,Berlin Aaron M.,Blatch Gregory L.,Buonocore Francesco,Burmester Thorsten,Campbell Michael S.,Canapa Adriana,Cannon John P.,Christoffels Alan,De Moro Gianluca,Edkins Adrienne L.,Fan Lin,Fausto Anna Maria,Feiner Nathalie,Forconi Mariko,Gamieldien Junaid,Gnerre Sante,Gnirke Andreas,Goldstone Jared V.,Haerty Wilfried,Hahn Mark E.,Hesse Uljana,Hoffmann Steve,Johnson Jeremy,Karchner Sibel I.,Kuraku Shigehiro,Lara Marcia,Levin Joshua Z.,Litman Gary W.,Mauceli Evan,Miyake Tsutomu,Mueller M. Gail,Nelson David R.,Nitsche Anne,Olmo Ettore,Ota Tatsuya,Pallavicini Alberto,Panji Sumir,Picone Barbara,Ponting Chris P.,Prohaska Sonja J.,Przybylski Dariusz,Saha Nil Ratan,Ravi Vydianathan,Ribeiro Filipe J.,Sauka-Spengler Tatjana,Scapigliati Giuseppe,Searle Stephen M. J.,Sharpe Ted,Simakov Oleg,Stadler Peter F.,Stegeman John J.,Sumiyama Kenta,Tabbaa Diana,Tafer Hakim,Turner-Maier Jason,van Heusden Peter,White Simon,Williams Louise,Yandell Mark,Brinkmann Henner,Volff Jean-Nicolas,Tabin Clifford J.,Shubin Neil,Schartl Manfred,Jaffe David B.,Postlethwait John H.,Venkatesh Byrappa,Di Palma Federica,Lander Eric S.,Meyer Axel,Lindblad-Toh Kerstin
Publisher
Springer Science and Business Media LLC