Author:
de Graaf S. E.,Danilov A. V.,Kubatkin S. E.
Publisher
Springer Science and Business Media LLC
Reference44 articles.
1. Lai, K. et al. Mesoscopic percolating resistance network in a strained manganite thin film. Science, 329, 190 (2010).
2. Anlage, S. M., Talanov, V. V. & Schwartz, A. R. In Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale, Volume 1. (Springer, 2007).
3. Rosner, B. T. & Van Der Weide, D. W. High-frequency near-field microscopy. Rev. Sci. Instrum. 73, 2505 (2002).
4. Plassard, C. et al. Detection of defects buried in metallic samples by scanning microwave microscopy. Phys. Rev. B. 83, 121409 (2011).
5. Bonnell, D. A. et al. Imaging physical phenomena with local probes: From electrons to photons. Rev. Mod. Phys. 84, 1343 (2012).
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