Absence of Evidence ≠ Evidence of Absence: Statistical Analysis of Inclusions in Multiferroic Thin Films

Author:

Schmidt Michael,Amann Andreas,Keeney Lynette,Pemble Martyn E.,Holmes Justin D.,Petkov Nikolay,Whatmore Roger W.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Reference31 articles.

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2. Watanabe, M. & Williams, D. Atomic-level detection by X-ray microanalysis in the analytical electron microscope. Ultmi 78, 89–101 (1999).

3. Carlson, T. A. Photoelectron and auger spectroscopy. PhT 29, 53, 10.1063/1.3023614 (1975).

4. Benninghoven, A., Rudenauer, F. & Werner, H. W. Secondary ion mass spectrometry: basic concepts, instrumental aspects, applications and trends. (Wiley, 1987).

5. Khuri-Yakub, B. Scanning acoustic microscopy. Ultra 31, 361–372 (1993).

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