Author:
Rothberg Jonathan M.,Hinz Wolfgang,Rearick Todd M.,Schultz Jonathan,Mileski William,Davey Mel,Leamon John H.,Johnson Kim,Milgrew Mark J.,Edwards Matthew,Hoon Jeremy,Simons Jan F.,Marran David,Myers Jason W.,Davidson John F.,Branting Annika,Nobile John R.,Puc Bernard P.,Light David,Clark Travis A.,Huber Martin,Branciforte Jeffrey T.,Stoner Isaac B.,Cawley Simon E.,Lyons Michael,Fu Yutao,Homer Nils,Sedova Marina,Miao Xin,Reed Brian,Sabina Jeffrey,Feierstein Erika,Schorn Michelle,Alanjary Mohammad,Dimalanta Eileen,Dressman Devin,Kasinskas Rachel,Sokolsky Tanya,Fidanza Jacqueline A.,Namsaraev Eugeni,McKernan Kevin J.,Williams Alan,Roth G. Thomas,Bustillo James
Publisher
Springer Science and Business Media LLC