Author:
Fullwood Melissa J.,Liu Mei Hui,Pan You Fu,Liu Jun,Xu Han,Mohamed Yusoff Bin,Orlov Yuriy L.,Velkov Stoyan,Ho Andrea,Mei Poh Huay,Chew Elaine G. Y.,Huang Phillips Yao Hui,Welboren Willem-Jan,Han Yuyuan,Ooi Hong Sain,Ariyaratne Pramila N.,Vega Vinsensius B.,Luo Yanquan,Tan Peck Yean,Choy Pei Ye,Wansa K. D. Senali Abayratna,Zhao Bing,Lim Kar Sian,Leow Shi Chi,Yow Jit Sin,Joseph Roy,Li Haixia,Desai Kartiki V.,Thomsen Jane S.,Lee Yew Kok,Karuturi R. Krishna Murthy,Herve Thoreau,Bourque Guillaume,Stunnenberg Hendrik G.,Ruan Xiaoan,Cacheux-Rataboul Valere,Sung Wing-Kin,Liu Edison T.,Wei Chia-Lin,Cheung Edwin,Ruan Yijun
Publisher
Springer Science and Business Media LLC