Time-resolved HAXPES using a microfocused XFEL beam: From vacuum space-charge effects to intrinsic charge-carrier recombination dynamics-Reference-Cited by-同舟云学术

Time-resolved HAXPES using a microfocused XFEL beam: From vacuum space-charge effects to intrinsic charge-carrier recombination dynamics

Published:2016-10-12 Issue:1 Volume:6 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Oloff Lars-Philip,Chainani Ashish,Matsunami Masaharu,Takahashi Kazutoshi,Togashi Tadashi,Osawa Hitoshi,Hanff Kerstin,Quer Arndt,Matsushita Ryuki,Shiraishi Ryutaro,Nagashima Maki,Kimura Ayato,Matsuishi Kotaro,Yabashi Makina,Tanaka Yoshihito,Rossi Giorgio,Ishikawa Tetsuya,Rossnagel Kai,Oura Masaki

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/srep35087.pdf

Reference41 articles.

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2. Lindau, I., Pianetta, P., Doniach, S. & Spicer, W. X-ray photoemission spectroscopy. Nature 250, 214 (1974).

3. Woicik, J. C. In Hard x-ray photoelectron spectroscopy (HAXPES) (ed. Woicik, J. C. ) (Springer International Publishing, 2015).

4. Oura, M. et al. Development of a single-shot CCD-based data acquisition system for time-resolved x-ray photoelectron spectroscopy at an x-ray free-electron laser facility. J. Synchrotron Rad. 21, 183 (2014).

5. Oura, M. et al. Electron dynamics probed by time-resolved hard x-ray photoelectron spectroscopy. Trans. Mat. Res. Soc. Jpn. 39, 469 (2014).

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