Decoupling the refractive index from the electrical properties of transparent conducting oxides via periodic superlattices-Reference-Cited by-同舟云学术

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Decoupling the refractive index from the electrical properties of transparent conducting oxides via periodic superlattices

Published:2016-09-15 Issue:1 Volume:6 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Caffrey David,Norton Emma,Coileáin Cormac Ó,Smith Christopher M.,Bulfin Brendan,Farrell Leo,Shvets Igor V.,Fleischer Karsten

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/srep33006.pdf

Reference48 articles.

1. Shen, J. et al. Low dielectric constant silica films with ordered nanoporous structure. Mater. Sci. Eng. C 27, 1145–1148 (2007).

2. Özgür, Ü. et al. A comprehensive review of ZnO materials and devices. J. Appl. Phys. 98, 041301 (2005).

3. Ellmer, K. Resistivity of polycrystalline zinc oxide films: current status and physical limit. J. Phys. D: Appl. Phys. 34, 3097 (2001).

4. Ellmer, K. Past achievements and future challenges in the development of optically transparent electrodes. Nat. Photonics 6, 809–817 (2012).

5. Wang, Z. et al. Growth of ZnO:Al films by RF sputtering at room temperature for solar cell applications. Solid-State Electron. 53, 1149–1153 (2009).

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